Perseverance is key, NTID's Hurwitz tells deaf grads

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Title: Perseverance is key, NTID's Hurwitz tells deaf grads
Author: NTID
Abstract: Dr. T. Alan Hurwitz, vice president for Rochester Institute of Technology and dean of the National Technical Institute for the Deaf, told deaf high school graduates that higher education and perseverance are critical to success.
Record URI: http://hdl.handle.net/1850/10374
Date: 2004-06-18

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