Adaption and application of morphological pseudoconvolutions to scanning tunneling and atomic force microscopy

Show simple item record

dc.contributor.advisor Dougherty, Edward
dc.contributor.advisor Vaez-Pravani, Mehdi
dc.contributor.advisor Mizes, Howard
dc.contributor.author Weisman, Andrew D.
dc.date.accessioned 2010-01-29T18:23:31Z
dc.date.available 2010-01-29T18:23:31Z
dc.date.issued 1991-08
dc.identifier.uri http://hdl.handle.net/1850/11231
dc.description.abstract A recently developed class of digital filters known as morphological pseudoconvolutions are adapted and applied to Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) images. These filters are shown to outperform, both visually and in the mean square error sense, previously introduced Wiener filtering techniques. The filters are compared on typical STM/AFM images, using both modeled and actual data. The technique is general, and is shown to perform very well on many types of STM and AFM images. en_US
dc.language.iso en_US en_US
dc.subject Image filter en_US
dc.subject.lcc QC173.4.S94W44 1991
dc.subject.lcsh Scanning tunneling microscopy en_US
dc.subject.lcsh Electron microscopy en_US
dc.subject.lcsh Digital filters (Mathematics) en_US
dc.title Adaption and application of morphological pseudoconvolutions to scanning tunneling and atomic force microscopy en_US
dc.type Thesis en_US
dc.description.college College of Science en_US
dc.description.department Chester F. Carlson Center for Imaging Science en_US

Files in this item

Files Size Format View
AWeismanThesis08-1991.pdf 3.814Mb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Search RIT DML


Advanced Search

Browse