High-resolution microscopy: Application to detector characterization and a new super-resolution technique

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Title: High-resolution microscopy: Application to detector characterization and a new super-resolution technique
Author: Kavaldjiev, Daniel
Abstract: The research, presented in this dissertation, consists of two parts. In the first half of the work a novel microscopy method, Frequency-domain Field- confined Scanning Optical Microscopy (FFSOM), capable of a resolution below the classical diffraction limit, is introduced. An experimental verification in the case of fluorescence microscopy is also presented, suggesting the biological microscopy research as an important application field. The second half of the thesis is devoted to an experimental measurement of the subpixel spatial variations in solid-state light detectors, namely in a Charge-Coupled Devices (CCD). A specialized high-resolution scanning optical microscope, is described. With the help of this microscope, the detector's pixel response function is measured with arguably the highest resolution that can be achieved in this type of measurements. The importance of the pixel response function knowledge is demonstrated in the case of photometric measurements in astronomy.
Record URI: http://hdl.handle.net/1850/13516
Date: 1997

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