Process improvement for the Eastman Kodak automated paint line using design of experiments

Show full item record

Redirect: RIT Scholars content from RIT Digital Media Library has moved from to RIT Scholar Works, please update your feeds & links!
Title: Process improvement for the Eastman Kodak automated paint line using design of experiments
Author: Traynor, Suzanne
Abstract: Design of experiments (DOE) is a systematic approach used to improve quality, increase profits, and decrease defects in a process in a cost effective and efficient manner. A DOE is important for getting a better understanding of the process and a better part to the customer. A DOE has been applied toward improving the electrodeposition process in Eastman Kodak's automated paint line (APL). A two level factorial model has been used as a screening design to help identify the important factors. The design was essentially broken up into sixteen small designs to account for different process parameters and different responses. To represent the different types of material and different shapes of the parts that are run through the process, the experiments looked at samples of straight stainless steel, straight aluminum, bent stainless steel and bent aluminum parts. The responses studied were the visual appearance, gloss, roughness and film thickness of the samples. The factors run in the screening experiments were chosen through the knowledge and the background information on the process provided by experts. The results were analyzed statistically and conclusions were made about the process. The best models were looked at more closely to determine which factors are truly important. Finally, recommendations for process improvements and for future studies were given to Eastman Kodak regarding the electrodeposition process.
Record URI:
Date: 1998-05-19

Files in this item

Files Size Format View
STraynorThesis05-19-1998.pdf 22.55Mb PDF View/Open

The following license files are associated with this item:

This item appears in the following Collection(s)

Show full item record

Search RIT DML

Advanced Search