Fraction of grains development measured by electrolytic grain size analyzer

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Title: Fraction of grains development measured by electrolytic grain size analyzer
Author: Wen, Zhenhuan
Abstract: Quantum sensitivity is an important emulsion property for photographic image formation and is usually calculated from a fraction of grains developable vs. log exposure (F-log E) curve. In this thesis, a new method, the electrolytic grain-size analyzer (EGSA) technique has been developed that will allow one to obtain F-log E curves for each grain size class in polydisperse emulsions. The correctness of the F-log E curve obtained by this new method has been examined by comparing the F-log E curve with that calculated from the normalized D-log E curve in the case of monodisperse emulsions. The problems in EGSA measurement, such as "noise" and emulsion solubility, which affect the accuracy of F-log E curves obtained by such a method, have been solved and are discussed in detail. The technique has been applied to the case of an emulsion with a bimodal grain size distribution.
Record URI: http://hdl.handle.net/1850/14083
Date: 1998-10

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