Chandra/ACIS subpixel event repositioning. II. Further refinements and comparison between backside and front-side illuminated X-ray CCDs

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dc.contributor.author Li, Jingqiang en_US
dc.contributor.author Kastner, Joel en_US
dc.contributor.author Prigozhin, Gregory en_US
dc.contributor.author Schulz, Norbert en_US
dc.contributor.author Feigelson, Eric en_US
dc.contributor.author Getman, Konstantin en_US
dc.date.accessioned 2006-05-22T18:53:00Z en_US
dc.date.available 2006-05-22T18:53:00Z en_US
dc.date.issued 2004-08-01 en_US
dc.identifier.citation Astrophys.J. 610 (2004) 1204-1212 en_US
dc.identifier.issn 1538-4365 en_US
dc.identifier.uri http://hdl.handle.net/1850/1841 en_US
dc.description.abstract We further investigate subpixel event repositioning (SER) algorithms in application to Chandra X-ray Observatory (CXO) CCD imaging. SER algorithms have been applied to backside illuminated (BI) Advanced CCD Imaging Spectrometer (ACIS) devices, and demonstrate spatial resolution improvements in Chandra/ACIS observations. Here a new SER algorithm that is charge split dependent is added to the SER family. We describe the application of SER algorithms to frontside illuminated (FI) ACIS devices. The results of SER for FI CCDs are compared with those obtained from SER techniques applied to BI CCD event data. Both simulated data and Chandra/ACIS observations of the Orion Nebular Cluster were used to test and evaluate the achievement of the various SER techniques. en_US
dc.description.sponsorship This research was supported by NASA/CXO grant G02-3009X to RIT. en_US
dc.format.extent 1365295 bytes en_US
dc.format.mimetype application/pdf en_US
dc.language.iso en_US en_US
dc.publisher Astrophysical Journal en_US
dc.relation.ispartofseries vol. 610 en_US
dc.relation.ispartofseries no. 2 en_US
dc.subject Instrumentation - detectors en_US
dc.subject Methods - data analysis en_US
dc.subject Techniques - image processing en_US
dc.subject X-rays - general en_US
dc.title Chandra/ACIS subpixel event repositioning. II. Further refinements and comparison between backside and front-side illuminated X-ray CCDs en_US
dc.type Article en_US
dc.identifier.url http://dx.doi.org/10.1086/421866

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