Ultrasound speckle feature extraction for scattering structure characterization

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Title: Ultrasound speckle feature extraction for scattering structure characterization
Author: Rao, Navalgund; Venkatraman, Shyam; Zhang, Yimou
Abstract: There has been a renewed interest in recent years aimed at understanding the relationship between the various different moments of the ultrasound echo signal and the scattering microstructure. This paper considers the variation of second normalized intensity moments with probe pulse bandwidth theoretically and experimentally. Slope and intercept on this graph are shown to be useful features for the microstructure characterization.
Description: "Ultrasound speckle feature extraction for scattering structure characterization," Proceedings of the IEEE 17th Conference: Engineering in Medicine and Biology Society. Institute of Electrical and Electronics Engineers. Held in Montreal, Quebec, Canada: 20-23 September 1995. ©1995 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Record URI: http://hdl.handle.net/1850/3174
Date: 1995-09-20

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