Ultrasound speckle feature extraction for scattering structure characterization

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dc.contributor.author Rao, Navalgund en_US
dc.contributor.author Venkatraman, Shyam en_US
dc.contributor.author Zhang, Yimou en_US
dc.date.accessioned 2006-12-18T18:13:32Z en_US
dc.date.available 2006-12-18T18:13:32Z en_US
dc.date.issued 1995-09-20 en_US
dc.identifier.citation Engineering in Medicine and Biology Society 1 (1995) 599-600 en_US
dc.identifier.isbn 0-7803-2475-7 en_US
dc.identifier.uri http://hdl.handle.net/1850/3174 en_US
dc.description "Ultrasound speckle feature extraction for scattering structure characterization," Proceedings of the IEEE 17th Conference: Engineering in Medicine and Biology Society. Institute of Electrical and Electronics Engineers. Held in Montreal, Quebec, Canada: 20-23 September 1995. ©1995 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. en_US
dc.description.abstract There has been a renewed interest in recent years aimed at understanding the relationship between the various different moments of the ultrasound echo signal and the scattering microstructure. This paper considers the variation of second normalized intensity moments with probe pulse bandwidth theoretically and experimentally. Slope and intercept on this graph are shown to be useful features for the microstructure characterization. en_US
dc.description.sponsorship This work was supported in part by a grant from the Whitaker Foundation. en_US
dc.format.extent 260247 bytes en_US
dc.format.mimetype application/pdf en_US
dc.language.iso en_US en_US
dc.publisher Institute of Electrical and Electronics Engineers (IEEE) en_US
dc.relation.ispartofseries vol. 1 en_US
dc.subject Biomedical ultrasonics en_US
dc.subject Feature extraction en_US
dc.subject Medical image processing en_US
dc.subject Speckle en_US
dc.subject Ultrasonic scattering en_US
dc.title Ultrasound speckle feature extraction for scattering structure characterization en_US
dc.type Proceedings en_US

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