Comparison of methods for generation of absolute reflectance factor values for bidirectional reflectance-distribution function studies

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Title: Comparison of methods for generation of absolute reflectance factor values for bidirectional reflectance-distribution function studies
Author: Feng, Xiaofan; Schott, John; Gallagher, Timothy
Abstract: Currently, spectrophotometric standard reference materials are calibrated only by using the illumination and viewing geometries recommended by the Commission Internationale de l'Eclairage, and for some geometries the spectral range is limited to the visible wavelengths. A need exists for procedures that calibrate standards at many other geometries and for a broader spectral range. Two methods for calibrating the spectral bidirectional reflectance factor are described. The absolute bidirectional reflectance factor of a sintered polytetrafluoroethylene (PTFE) sample is determined for nearly all the possible illumination and viewing geometries from 400 nm to 2500 nm. The references are a 45/0 reflectance standard calibrated by the National Institute of Standards and Technology and a sintered PTFE sample with a directional, hemispherical reflectance factor traceable to the Institute. The results of the two methods agree to within 0.01 in reflectance factor values. With this PTFE sample as a transfer standard, the instrument described can also be used to measure the absolute bidirectional reflectance factor at nearly all the illumination and viewing geometries from 400 nm to 2500 nm.
Description: RIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/
Record URI: http://hdl.handle.net/1850/4234
Publishers URL: http://dx.doi.org/10.1364/AO.32.001234
Date: 1993-03

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