Sulfide centers on (111) AgBr surfaces: Characterization

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Title: Sulfide centers on (111) AgBr surfaces: Characterization
Author: Hailstone, Richard; Zhao, T.; DiFrancesco, A. Gary; Tyne, Monica
Abstract: Sensitometric and spectroscopic techniques are used to characterize sensitizer centers produced by sulfur sensitization of AgBr octahedra. Sulfur sensitization primarily affects the long wavelength sensitivity in two spectral regions-around 550 nm and around 650-700 nm. The concentration dependence of the long wavelength sensitivity in these two regions shows the former to be associated with single-sulfide centers and the latter to be associated with double-sulfide centers. The achievement of maximum photographic speed is associated with the production of the double-sulfide centers. A prominent 495 nm peak is observed in diffuse reflectance spectroscopy of these emulsions that is not observed in the long wavelength sensitivity measurements. This peak is assigned to a product of the sulfur sensitization that is not photographically active.
Description: This article may be accessed on the publisher's website (additional fees may apply) at: http://www.imaging.org/store/epub.cfm?abstrid=5956
Record URI: http://hdl.handle.net/1850/4307
Date: 2001-01

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