A new approach to measuring the fraction of grains developable for polydisperse emulsions

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Title: A new approach to measuring the fraction of grains developable for polydisperse emulsions
Author: Wen, Zhenhuan; DiFrancesco, A. Gary; Hailstone, Richard
Abstract: Quantum sensitivity is an important emulsion property for photographic image formation and is usually calculated from a fraction of grains developable vs. log exposure curve (F-log E curve). A new method, residual grain size analysis using the electrolytic grain-size analyzer (EGSA) to detect undeveloped grains, has been developed that will allow one to readily obtain F-log E curves for each grain size class in polydisperse emulsions. The correctness of the F-log E curve derived by this new method has been examined by comparing the F-log E curve with that calculated from the normalized D-log E curve in the case of mono-disperse emulsions. The problems in EGSA measurement, such as noise and emulsion removal from film base, which affect the accuracy of F-log E curves derived by such a method, have been solved and are discussed in detail. The method has been applied to the case of an emulsion with a bimodal grain size distribution.
Description: This article may be accessed on the publisher's website (additional fees may apply) at: http://www.imaging.org/store/epub.cfm?abstrid=2729
Record URI: http://hdl.handle.net/1850/4310
Date: 2000-05

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