Parametrical characterization of leakage power in nanoscale technologies

Show simple item record

dc.contributor.author Kudithipudi, Dhireesha
dc.contributor.author John, E.
dc.date.accessioned 2008-10-21T13:56:34Z
dc.date.available 2008-10-21T13:56:34Z
dc.date.issued 2005-07
dc.identifier.uri http://hdl.handle.net/1850/7268
dc.description Proceedings a Public session at the University of Texas, San Antonio. en_US
dc.language.iso en_US en_US
dc.title Parametrical characterization of leakage power in nanoscale technologies en_US
dc.type Proceedings en_US

Files in this item

Files Size Format View
DKudithipudiConfProc07-2005.pdf 73.64Kb PDF View/Open

This item appears in the following Collection(s)

Show simple item record

Search RIT DML


Advanced Search

Browse