Cluster reputation and the internationalization process of small and medium sized enterprises

Show full item record

Title: Cluster reputation and the internationalization process of small and medium sized enterprises
Author: Zyglidopoulos, Stelios; DeMartino, Richard; Reid, David
Abstract: The Internationalization of Small and Medium Sized Enterprises (SMEs) is faced with a number of constraints, such as managerial and financial ones. But, the presence of SMEs within industrial clusters often allows them to access a number of positive cluster related externalities, which assist their internationalization process in many ways. In this paper, we investigate the impact that cluster reputation can have on the internationalization process of SMEs. In particular, drawing on extensive empirical research of the Rochester Photonics Cluster in Rochester, New York, we develop a model on the 'how' cluster reputation can facilitate the internationalization process of SMEs, and set forth a number of propositions regarding this influence. Finally, the paper concludes with a discussion of its implications for academic research and managerial practice.
Description: This is a post-peer-review, pre-copyedit version of an article published in Corporate Reputation Review. The definitive publisher-authenticated version Cluster Reputation as a Facilitator in the Internationalization of Small and Medium Sized Enterprises, with Stelios Zyglidopoulos and David Reid, June 9, 2006 is available online at: http://www.palgrave-journals.com/pal/index.htmlRIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/RIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/
Record URI: http://hdl.handle.net/1850/7665
Date: 2003-06-09

Files in this item

Files Size Format View
PalgraveMacMillanArchivePolicy.pdf 101.4Kb PDF View/Open

The following license files are associated with this item:

This item appears in the following Collection(s)

Show full item record

Search RIT DML


Advanced Search

Browse