The Mock LISA data challenges: from challenge 1B to challenge 3

Show full item record

Title: The Mock LISA data challenges: from challenge 1B to challenge 3
Author: Babak, Stanislav; Baker, John; Benacquista, Matthew; Cornish, Neil; Crowder, Jeff; Larson, Shane; Plagnol, Eric; Porter, Edward; Vallisneri, Michele; Vecchio, Alberto; Arnaud, Keith; Barack, Leor; Blaut, Arkadiusz; Cutler, Curt; Fairhurst, Stephen; Gair, Jonathan; Gong, Xuefei; Harry, Ian; Khurana, Deepak; Krolak, Andrezej; Mandel, Ilya; Prix, Reinhard; Sathyaprakash, B; Savov, Pavlin; Shang, Yu; Trias, Miquel; Veitch, John; Wang, Yan; Wen, Linqing; Whelan, John
Abstract: The Mock LISA Data Challenges are a programme to demonstrate and encourage the development of LISA data-analysis capabilities, tools and techniques. At the time of this workshop, three rounds of challenges had been completed, and the next was about to start. In this article we provide a critical analysis of entries to the latest completed round, Challenge 1B. The entries confirm the consolidation of a range of data-analysis techniques for Galactic and massive–black-hole binaries, and they include the first convincing examples of detection and parameter estimation of extreme–mass-ratio inspiral sources. In this article we also introduce the next round, Challenge 3. Its data sets feature more realistic waveform models (e.g., Galactic binaries may now chirp, and massive– black-hole binaries may precess due to spin interactions), as well as new source classes (bursts from cosmic strings, isotropic stochastic backgrounds) and more complicated nonsymmetric instrument noise.
Description: Also archived in arXiv:0806.2110 v1 Jun 12, 2008. Proceedings from the 12th Gravitational Wave Data Analysis Workshop, Cambridge MA, from 13-16 December 2007
Record URI:
Date: 2008-09-21

Files in this item

Files Size Format View
JWhelanConfProc09-21-2008.pdf 427.6Kb PDF View/Open

The following license files are associated with this item:

This item appears in the following Collection(s)

Show full item record

Search RIT DML

Advanced Search