Characterization of physical defects and fault analysis of molecular and nanoscaled integrated circuits

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Title: Characterization of physical defects and fault analysis of molecular and nanoscaled integrated circuits
Author: Lyshevski, Sergey
Abstract: This paper reports a concept to design the defect-tolerant molecular integrated circuits (MICs). The results are applicable to conventional ICs which utilize solid-state devices. By enhancing photolithography and other CMOS processes, advancing materials and optimizing devices, some device and circuit performance were improved. Unfortunately, some key performance characteristics and capabilities were significantly degraded. The performance tradeoffs and effects of the equivalent cell size reduction are well known. The defects and faults at the device and circuit levels must be accommodated. It is illustrated that in general, the defects and faults can be accommodated.
Description: Copyright 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Record URI: http://hdl.handle.net/1850/8964
Date: 2008-08

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